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Non destructive measurement services3
https://www.omsure.com/zh/ 歐美科技股份有限公司
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Non destructive measurement services

Non destructive measurement services for Si / SiC / Glass fabrication processes

Typical items:

•Film thickness and optical properties
•TSV depth and uniformity
•TGV depth, TGV sidewall angle, TGV 3D tomography
•RDL depth and uniformity








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