Semiconductor Advanced Inspection and Metrology Forum

OmniMeasure will give a presentation "In-line Wafer Level Inspection and Diagnosis System for Deep Etching in 3D IC Fabrication"

• Date: Friday, September 8, 2023
• Time: 14:10- 14:50 (08:30-09:00 for registration)
• Venue: 505ab, 5F, TaiNEX 1
• Theme: Building a Resilient Global Semiconductor Supply Chain
• Advised by: SEMI Taiwan Inspection and Metrology Committee
• Forum Chair: Dr. I-Shih Tseng, President, Chroma ATE