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Automatic TSV (Through Silicon Via) inspection system ViaMaster A100

Function: automatic measurement for TSV depth; oxide, nitride, PR, PI film thickness; wafer profile
Automatic TSV (Through Silicon Via) / Deep Trench inspection system ViaMaster A200

Function: automatic measurement for TSV / deep-trench depth; oxide, nitride, PR, PI film thickness; wafer profile; wafer tilt angle
Film Metrology Unit

Function: automatic measurement for oxide, nitride, PR, PI film thickness; wafer profile